A feasibility study and the corresponding design flow for robust millimeter wave GaN LNAs is provided in this paper. Particular attention is devoted to the selection of the optimum geometry of the first stage active device. A trade-off is shown between noise performance and robustness requirements. The beneficial effects of source degenerative feedback are shown. The LNA's simulated performance are gain > 20B, NF < 1.7dB and power handling capability verified up to +20 dBm input power in CW operation. This design is well suited for operation in high reliability systems, such as space operation on airborne applications.

Pace, L., Longhi, P.e., Limiti, E. (2020). Feasibility study and design of a robust low-noise amplifier operating at millimeter-wave for high reliability applications. INTERNATIONAL JOURNAL OF MICROWAVE AND OPTICAL TECHNOLOGY, 15(5), 470-479.

Feasibility study and design of a robust low-noise amplifier operating at millimeter-wave for high reliability applications

Longhi P. E.;Limiti E.
2020-01-01

Abstract

A feasibility study and the corresponding design flow for robust millimeter wave GaN LNAs is provided in this paper. Particular attention is devoted to the selection of the optimum geometry of the first stage active device. A trade-off is shown between noise performance and robustness requirements. The beneficial effects of source degenerative feedback are shown. The LNA's simulated performance are gain > 20B, NF < 1.7dB and power handling capability verified up to +20 dBm input power in CW operation. This design is well suited for operation in high reliability systems, such as space operation on airborne applications.
2020
Pubblicato
Rilevanza internazionale
Articolo
Esperti anonimi
Settore ING-INF/01 - ELETTRONICA
English
Gallium nitride
Ka-band
Millimeter-wave robust low-noise amplifiers
Thermal reliability
Pace, L., Longhi, P.e., Limiti, E. (2020). Feasibility study and design of a robust low-noise amplifier operating at millimeter-wave for high reliability applications. INTERNATIONAL JOURNAL OF MICROWAVE AND OPTICAL TECHNOLOGY, 15(5), 470-479.
Pace, L; Longhi, Pe; Limiti, E
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/253869
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