Reflectance anisotropy spectroscopy (RAS) has recently been used to monitor in situ and in real time the growth of thin organic layers in ultra high vacuum (UHV) (Goletti et al 2003 Appl. Phys. Lett. 83 4146). In this paper, after a short discussion of RAS, with particular attention to the application to organics, we present recent results on the deposition of ordered oligothiophene films by organic molecular beam epitaxy (OMBE), namely alpha-sexithiophene and quaterthiophene films onto potassium acid phthalate substrates.

Goletti, C., Bussetti, G., Chiaradia, P., Sassella, A., Borghesi, A. (2004). In situ optical investigation of oligothiophene layers grown by organic molecular beam epitaxy. JOURNAL OF PHYSICS. CONDENSED MATTER, 16(39) [10.1088/0953-8984/16/39/014].

In situ optical investigation of oligothiophene layers grown by organic molecular beam epitaxy

GOLETTI, CLAUDIO;BUSSETTI, GIANLORENZO;CHIARADIA, PIETRO;
2004-01-01

Abstract

Reflectance anisotropy spectroscopy (RAS) has recently been used to monitor in situ and in real time the growth of thin organic layers in ultra high vacuum (UHV) (Goletti et al 2003 Appl. Phys. Lett. 83 4146). In this paper, after a short discussion of RAS, with particular attention to the application to organics, we present recent results on the deposition of ordered oligothiophene films by organic molecular beam epitaxy (OMBE), namely alpha-sexithiophene and quaterthiophene films onto potassium acid phthalate substrates.
2004
Pubblicato
Rilevanza internazionale
Articolo
Sì, ma tipo non specificato
Settore FIS/03 - FISICA DELLA MATERIA
English
Con Impact Factor ISI
Anisotropy; Photons; Potassium; Spectroscopic analysis; Substrates; Ultrahigh vacuum; Organic layers; Organic molecular beam epitaxy (OMBE); Quaterthiophene films; Reflectance anisotropy spectroscopy (RAS); Molecular beam epitaxy
Goletti, C., Bussetti, G., Chiaradia, P., Sassella, A., Borghesi, A. (2004). In situ optical investigation of oligothiophene layers grown by organic molecular beam epitaxy. JOURNAL OF PHYSICS. CONDENSED MATTER, 16(39) [10.1088/0953-8984/16/39/014].
Goletti, C; Bussetti, G; Chiaradia, P; Sassella, A; Borghesi, A
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/25000
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