An innovative, single-shot, non-intercepting monitor of the transverse profile of plasma-accelerated electron beams is presented, based on the simultaneous measurement of the electron energy and the betatron radiation spectra. The spatial resolution is shown to be down to few tens of nanometers, important for high-precision applications requiring fine shaping of beams and detailed characterizations of the electron transverse phase space at the exit of plasma accelerating structures
Curcio, A., Anania, M., Bisesto, F., Chiadroni, E., Cianchi, A., Ferrario, M., et al. (2017). Single-shot non-intercepting profile monitor of plasma-accelerated electron beams with nanometric resolution. APPLIED PHYSICS LETTERS, 111(13), 133105 [10.1063/1.4998932].
Single-shot non-intercepting profile monitor of plasma-accelerated electron beams with nanometric resolution
Cianchi, A.;
2017-01-01
Abstract
An innovative, single-shot, non-intercepting monitor of the transverse profile of plasma-accelerated electron beams is presented, based on the simultaneous measurement of the electron energy and the betatron radiation spectra. The spatial resolution is shown to be down to few tens of nanometers, important for high-precision applications requiring fine shaping of beams and detailed characterizations of the electron transverse phase space at the exit of plasma accelerating structures| File | Dimensione | Formato | |
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