This paper presents a neutron accelerated study of soft errors in advanced electronic devices used in space missions, i.e. Flash memories performed at the ChipIr and VESUVIO beam lines at the ISIS spallation neutron source. The two neutron beam lines are set up to mimic the space environment spectra and allow neutron irradiation tests on Flash memories in the neutron energy range above 10 MeV and up to 800 MeV. The ISIS neutron energy spectrum is similar to the one occurring in the atmospheric as well as in space and planetary environments, with intensity enhancements varying in the range 108- 10 9 and 106- 10 7 respectively. Such conditions are suitable for the characterization of the atmospheric, space and planetary neutron radiation environments, and are directly applicable for accelerated tests of electronic components as demonstrated here in benchmark measurements performed on flash memories.

Andreani, C., Senesi, R., Paccagnella, A., Bagatin, M., Gerardin, S., Cazzaniga, C., et al. (2018). Fast neutron irradiation tests of flash memories used in space environment at the ISIS spallation neutron source. AIP ADVANCES, 8(2), 025013 [10.1063/1.5017945].

Fast neutron irradiation tests of flash memories used in space environment at the ISIS spallation neutron source

C. Andreani;R. Senesi
Writing – Original Draft Preparation
;
P. Picozza;R. Mancini;
2018-02-16

Abstract

This paper presents a neutron accelerated study of soft errors in advanced electronic devices used in space missions, i.e. Flash memories performed at the ChipIr and VESUVIO beam lines at the ISIS spallation neutron source. The two neutron beam lines are set up to mimic the space environment spectra and allow neutron irradiation tests on Flash memories in the neutron energy range above 10 MeV and up to 800 MeV. The ISIS neutron energy spectrum is similar to the one occurring in the atmospheric as well as in space and planetary environments, with intensity enhancements varying in the range 108- 10 9 and 106- 10 7 respectively. Such conditions are suitable for the characterization of the atmospheric, space and planetary neutron radiation environments, and are directly applicable for accelerated tests of electronic components as demonstrated here in benchmark measurements performed on flash memories.
Pubblicato
Rilevanza internazionale
Articolo
Esperti anonimi
Settore FIS/07 - Fisica Applicata(Beni Culturali, Ambientali, Biol.e Medicin)
English
Con Impact Factor ISI
Radiation environment, Flash memories, ChipIr, VESUVIO, ISIS spallation neutron source
Andreani, C., Senesi, R., Paccagnella, A., Bagatin, M., Gerardin, S., Cazzaniga, C., et al. (2018). Fast neutron irradiation tests of flash memories used in space environment at the ISIS spallation neutron source. AIP ADVANCES, 8(2), 025013 [10.1063/1.5017945].
Andreani, C; Senesi, R; Paccagnella, A; Bagatin, M; Gerardin, S; Cazzaniga, C; Frost, Cd; Picozza, P; Gorini, G; Mancini, R; Sarno, M
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/2108/194736
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