A method based on the analysis of both the amplitude and phase of the photothermal deflection spectroscopy signal which enables one to locate surface states on the front or rear surface of semiconductor wafers and to measure their absorption. The procedure also allows the determination of the sample thermal conductivity.

Zammit, U., Gasparrini, F., Marinelli, M., Pizzoferrato, R., Scudieri, F., & Martellucci, S. (1991). Surface states studies in semiconductors by photothermal deflection spectroscopy. JOURNAL OF APPLIED PHYSICS, 69(4), 2577-2580 [10.1063/1.348646].

Surface states studies in semiconductors by photothermal deflection spectroscopy

ZAMMIT, UGO;MARINELLI, MASSIMO;PIZZOFERRATO, ROBERTO;SCUDIERI, FOLCO;MARTELLUCCI, SERGIO
1991

Abstract

A method based on the analysis of both the amplitude and phase of the photothermal deflection spectroscopy signal which enables one to locate surface states on the front or rear surface of semiconductor wafers and to measure their absorption. The procedure also allows the determination of the sample thermal conductivity.
Pubblicato
Rilevanza internazionale
Articolo
Esperti anonimi
Settore FIS/01 - Fisica Sperimentale
Settore FIS/07 - Fisica Applicata(Beni Culturali, Ambientali, Biol.e Medicin)
English
Con Impact Factor ISI
Physics and Astronomy (miscellaneous)
Zammit, U., Gasparrini, F., Marinelli, M., Pizzoferrato, R., Scudieri, F., & Martellucci, S. (1991). Surface states studies in semiconductors by photothermal deflection spectroscopy. JOURNAL OF APPLIED PHYSICS, 69(4), 2577-2580 [10.1063/1.348646].
Zammit, U; Gasparrini, F; Marinelli, M; Pizzoferrato, R; Scudieri, F; Martellucci, S
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/131764
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