The reflectance anisotropy of the As/InP(110) surface is calculated by using an ab initio plane-wave pseudopotential method. We analyze different models of As coverage, ranging from non-reacted epitaxial layers to exchange-reacted geometries. Comparison with experimental data confirms that the annealed, highly ordered surface phase can be described by an InAs monolayer on the InP substrate (exchange reacted model), whereas the reflectance anisotropy of the as-grown, poorly ordered As/InP surface probably is dominated by disorder effects. (C) 1998 Elsevier Science B.V. All rights reserved.

Pulci, O., Grossner, U., Bechstedt, F. (1998). Theoretical study of As overlayers on InP(110) surface: optical properties. SURFACE SCIENCE, 417(1), L1133-L1138 [10.1016/S0039-6028(98)00648-7].

Theoretical study of As overlayers on InP(110) surface: optical properties

PULCI, OLIVIA;
1998-01-01

Abstract

The reflectance anisotropy of the As/InP(110) surface is calculated by using an ab initio plane-wave pseudopotential method. We analyze different models of As coverage, ranging from non-reacted epitaxial layers to exchange-reacted geometries. Comparison with experimental data confirms that the annealed, highly ordered surface phase can be described by an InAs monolayer on the InP substrate (exchange reacted model), whereas the reflectance anisotropy of the as-grown, poorly ordered As/InP surface probably is dominated by disorder effects. (C) 1998 Elsevier Science B.V. All rights reserved.
1998
Pubblicato
Rilevanza internazionale
Articolo
Esperti anonimi
Settore FIS/03 - FISICA DELLA MATERIA
English
Pulci, O., Grossner, U., Bechstedt, F. (1998). Theoretical study of As overlayers on InP(110) surface: optical properties. SURFACE SCIENCE, 417(1), L1133-L1138 [10.1016/S0039-6028(98)00648-7].
Pulci, O; Grossner, U; Bechstedt, F
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/114808
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