Three layers, NbN based Josephson junction, has been growth by RF and by DC sputtering within the constrain required by the photolithography technology. An interesting superconducting film with critical temperature of Tc = 14 K, well above the temperature of the commercial cryocooler, has been obtained reducing sputtering power and finding a proper N2 concentration in the gas mixture. The search of the new sputtering parameters has been obtained with the help of electron spectroscopy and X-ray diffraction analysis.

Lucci, M., Thanh, H., Davoli, I. (2008). Electron spectroscopy analysis on NbN to grow and characterize NbN/AlN/NbN Josephson junction. SUPERLATTICES AND MICROSTRUCTURES, 43(5-6), 518-523 [10.1016/j.spmi.2007.07.029].

Electron spectroscopy analysis on NbN to grow and characterize NbN/AlN/NbN Josephson junction

LUCCI, MASSIMILIANO;DAVOLI, IVAN
2008-01-01

Abstract

Three layers, NbN based Josephson junction, has been growth by RF and by DC sputtering within the constrain required by the photolithography technology. An interesting superconducting film with critical temperature of Tc = 14 K, well above the temperature of the commercial cryocooler, has been obtained reducing sputtering power and finding a proper N2 concentration in the gas mixture. The search of the new sputtering parameters has been obtained with the help of electron spectroscopy and X-ray diffraction analysis.
2008
Pubblicato
Rilevanza internazionale
Articolo
Sì, ma tipo non specificato
Settore FIS/03 - FISICA DELLA MATERIA
English
Con Impact Factor ISI
Nitride; Superconducting; Electronic spectroscopy; Josephson junction
http://www.sciencedirect.com/science/article/pii/S0749603607002248
Lucci, M., Thanh, H., Davoli, I. (2008). Electron spectroscopy analysis on NbN to grow and characterize NbN/AlN/NbN Josephson junction. SUPERLATTICES AND MICROSTRUCTURES, 43(5-6), 518-523 [10.1016/j.spmi.2007.07.029].
Lucci, M; Thanh, H; Davoli, I
Articolo su rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/59863
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