A new and simple approach for the measurement of active device dynamic output I/V characteristics is presented. Device characterisation is performed making use of multi-harmonic exciting signal and variable loads at the output port. The measurement bench has been used to characterise a GaAs 1 mm gate periphery PHEMT as a test vehicle. The results, obtained making use of the proposed setup, successfully compare with those obtained via traditional pulsed measurement systems.
Limiti, E., Nanni, A., Serino, A., Giannini, F. (2008). Alternative approach to dynamic I/V characterisation of microwave FETs. ELECTRONICS LETTERS, 44(14), 852-854 [10.1049/el:20080776].
Alternative approach to dynamic I/V characterisation of microwave FETs
LIMITI, ERNESTO;SERINO, ANTONIO;GIANNINI, FRANCO
2008-07-01
Abstract
A new and simple approach for the measurement of active device dynamic output I/V characteristics is presented. Device characterisation is performed making use of multi-harmonic exciting signal and variable loads at the output port. The measurement bench has been used to characterise a GaAs 1 mm gate periphery PHEMT as a test vehicle. The results, obtained making use of the proposed setup, successfully compare with those obtained via traditional pulsed measurement systems.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
