To completely characterise the noise behaviour of a two port device, four noise parameters F-min, R-n, G(opt), and B-opt, must be determined. This paper reports improvements in the uncertainty related to the above parameters, taking into account measurement errors due both to the limited instrument precision and connection repeatability. Results are reported for noise characterisation of 0.3 mum delta -doped HEMT devices by Alenia, demonstrating as the common hot-cold measurement procedure can result with an error confidence as low as 0.2% for all the noise parameters.
Acciari, G., Giannini, F., Limiti, E., Saggio, G. (2000). Lowering the uncertainty in fast noise measurement procedures. In 13th International conference on microwaves, radar and wireless communications (MIKON-2000) (pp.531-534). Warsaw : PIT- Telecommunications res institute [10.1109/MIKON.2000.913988].
Lowering the uncertainty in fast noise measurement procedures
ACCIARI, GIANLUCA;GIANNINI, FRANCO;LIMITI, ERNESTO;SAGGIO, GIOVANNI
2000-01-01
Abstract
To completely characterise the noise behaviour of a two port device, four noise parameters F-min, R-n, G(opt), and B-opt, must be determined. This paper reports improvements in the uncertainty related to the above parameters, taking into account measurement errors due both to the limited instrument precision and connection repeatability. Results are reported for noise characterisation of 0.3 mum delta -doped HEMT devices by Alenia, demonstrating as the common hot-cold measurement procedure can result with an error confidence as low as 0.2% for all the noise parameters.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
