The composite, consisting of Ti6Al4V matrix reinforced by unidirectional SiC fibres (SCS-6), has been investigated by mechanical spectroscopy at temperatures up to 1,173 K. For comparison, the same experiments have been performed on the corresponding monolithic alloy. The internal friction (IF) spectrum of the composite exhibits a new relaxation peak superimposed to an exponentially increasing background. This peak, which is not present in the monolithic alloy, has an activation energy H = 186 kJ mol-1 and a relaxation time 0 = 2.3 x 10-15 s. The phenomenon has been attributed to a reorientation of interstitial-substitutional pairs in the phase of Ti6Al4V matrix around the fibres. This explanation is supported by the results of micro-chemical characterization carried out by X-ray photoelectron spectroscopy (XPS) combined with Ar ion sputtering.
Montanari, R., Deodati, P., Donnini, R., Kaciulis, S., Mezzi, A., Testani, C., et al. (2010). Anelastic phenomena at the fibre-matrix interface of the Ti6Al4V-SiC composite. In Trends in composite materials and their design (pp. 263-270). Scientific.Net [10.4028/www.scientific.net/KEM.425.263].
Anelastic phenomena at the fibre-matrix interface of the Ti6Al4V-SiC composite
MONTANARI, ROBERTO;UCCIARDELLO, NADIA
2010-01-01
Abstract
The composite, consisting of Ti6Al4V matrix reinforced by unidirectional SiC fibres (SCS-6), has been investigated by mechanical spectroscopy at temperatures up to 1,173 K. For comparison, the same experiments have been performed on the corresponding monolithic alloy. The internal friction (IF) spectrum of the composite exhibits a new relaxation peak superimposed to an exponentially increasing background. This peak, which is not present in the monolithic alloy, has an activation energy H = 186 kJ mol-1 and a relaxation time 0 = 2.3 x 10-15 s. The phenomenon has been attributed to a reorientation of interstitial-substitutional pairs in the phase of Ti6Al4V matrix around the fibres. This explanation is supported by the results of micro-chemical characterization carried out by X-ray photoelectron spectroscopy (XPS) combined with Ar ion sputtering.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
