This paper discusses radiation tests on complex System-on-Chip (SoC) controllers using Low-Energy Protons (LEPs). The aim of this novel set of guidelines is to be also applicable to System In Package (SIP) or hybrid components that are now often used to overcome printed circuit board's real estate restrictions in Hi-Rel electronics.

Furano, G., Di Mascio, S., Szewczyk, T., Menicucci, A., Campajola, L., Di Capua, F., et al. (2016). A novel method for SEE validation of complex SoCs using Low-Energy Proton beams. In 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), (pp.131-134). IEEE [10.1109/DFT.2016.7684084].

A novel method for SEE validation of complex SoCs using Low-Energy Proton beams

OTTAVI, MARCO
2016-01-01

Abstract

This paper discusses radiation tests on complex System-on-Chip (SoC) controllers using Low-Energy Protons (LEPs). The aim of this novel set of guidelines is to be also applicable to System In Package (SIP) or hybrid components that are now often used to overcome printed circuit board's real estate restrictions in Hi-Rel electronics.
29th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016
University of Connecticut, usa
2016
Rilevanza internazionale
2016
Settore ING-INF/01 - ELETTRONICA
English
Intervento a convegno
Furano, G., Di Mascio, S., Szewczyk, T., Menicucci, A., Campajola, L., Di Capua, F., et al. (2016). A novel method for SEE validation of complex SoCs using Low-Energy Proton beams. In 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), (pp.131-134). IEEE [10.1109/DFT.2016.7684084].
Furano, G; Di Mascio, S; Szewczyk, T; Menicucci, A; Campajola, L; Di Capua, F; Fabbri, A; Ottavi, M
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/166260
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