Yttrium-doped barium zirconate (BZY) thin films recently showed surprising electric transport properties. Experimental investigations conducted mainly by electrochemical impedance spectroscopy suggested that a consistent part of this BZY conductivity is of protonic nature. These results have stimulated further investigations by local unconventional techniques. Here, we use electrochemical strain microscopy (ESM) to detect electrochemical activity in BZY films with nanoscale resolution. ESM in a novel cross-sectional measuring setup allows the direct visualization of the interfacial activity. The local electrochemical investigation is compared with the structural studies performed by state of art scanning transmission electron microscopy (STEM). The ESM and STEM results show a clear correlation between the conductivity and the interface structural defects. We propose a physical model based on a misfit dislocation network that introduces a novel 2D transport phenomenon, whose fingerprint is the low activation energy measured. (Figure Presented). © 2015 American Chemical Society.

Yang, N., Cantoni, C., Foglietti, V., Tebano, A., Belianinov, A., Strelcov, E., et al. (2015). Defective Interfaces in Yttrium-Doped Barium Zirconate Films and Consequences on Proton Conduction. NANO LETTERS, 15(4), 2343-2349 [10.1021/acs.nanolett.5b00698].

Defective Interfaces in Yttrium-Doped Barium Zirconate Films and Consequences on Proton Conduction

TEBANO, ANTONELLO;DI CASTRO, DANIELE;DI BARTOLOMEO, ELISABETTA;LICOCCIA, SILVIA;BALESTRINO, GIUSEPPE;
2015-01-01

Abstract

Yttrium-doped barium zirconate (BZY) thin films recently showed surprising electric transport properties. Experimental investigations conducted mainly by electrochemical impedance spectroscopy suggested that a consistent part of this BZY conductivity is of protonic nature. These results have stimulated further investigations by local unconventional techniques. Here, we use electrochemical strain microscopy (ESM) to detect electrochemical activity in BZY films with nanoscale resolution. ESM in a novel cross-sectional measuring setup allows the direct visualization of the interfacial activity. The local electrochemical investigation is compared with the structural studies performed by state of art scanning transmission electron microscopy (STEM). The ESM and STEM results show a clear correlation between the conductivity and the interface structural defects. We propose a physical model based on a misfit dislocation network that introduces a novel 2D transport phenomenon, whose fingerprint is the low activation energy measured. (Figure Presented). © 2015 American Chemical Society.
2015
Pubblicato
Rilevanza internazionale
Articolo
Esperti anonimi
Settore FIS/03 - FISICA DELLA MATERIA
English
Con Impact Factor ISI
Activation energy; Barium; Defects; Dislocations (crystals); Electrochemical impedance spectroscopy; Electrolytes; Interfaces (materials); Ionic conduction; Oxide films; Scanning electron microscopy; Thin films; Transmission electron microscopy; Transport properties; Yttrium, Electric transport properties; Electrochemical investigations; Electrochemical strain microscopies; Interface defects; Perovskite oxide thin films; Scanning transmission electron microscopy; SPM; STEM, Barium zirconate; doped barium zirconate; electrolytes; interface defects; ionic conduction; perovskite oxide thin films; SPM; STEM
http://www.scopus.com/inward/record.url?eid=2-s2.0-84926684412&partnerID=40&md5=4ff4d85da6879190a4186d68e23d1400
Yang, N., Cantoni, C., Foglietti, V., Tebano, A., Belianinov, A., Strelcov, E., et al. (2015). Defective Interfaces in Yttrium-Doped Barium Zirconate Films and Consequences on Proton Conduction. NANO LETTERS, 15(4), 2343-2349 [10.1021/acs.nanolett.5b00698].
Yang, N; Cantoni, C; Foglietti, V; Tebano, A; Belianinov, A; Strelcov, E; Jesse, S; DI CASTRO, D; DI BARTOLOMEO, E; Licoccia, S; Kalinin, S; Balestrino, G; Aruta, C
Articolo su rivista
File in questo prodotto:
File Dimensione Formato  
acs.nanolett.5b00698.pdf

solo utenti autorizzati

Licenza: Copyright dell'editore
Dimensione 5.06 MB
Formato Adobe PDF
5.06 MB Adobe PDF   Visualizza/Apri   Richiedi una copia

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/131396
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 24
  • ???jsp.display-item.citation.isi??? 24
social impact